A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS

Xin Zhang, Po-Hung Chen, Y. Ryu, K. Ishida, Yasuyuki Okuma, Kazunori Watanabe, T. Sakurai, M. Takamiya
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引用次数: 1

Abstract

A low voltage buck DC-DC converter (0.45-V input, 0.4-V output) with on-chip gate boosted (OGB) and clock frequency scaled digital PWM controller is designed in 40-nm CMOS process. The highest efficiency to date is achieved at the output power less than 40μW. In order to compensate for the die-to-die delay variations of a delay line in the proposed digital PWM controller, a linear delay trimming by a logarithmic stress voltage (LSV) scheme with good controllability is also proposed and verified in measurement.
采用片上栅极升压技术的40nm CMOS低压降压DC-DC变换器
设计了一种输入0.45 v,输出0.4 v的片上栅极升压(OGB)和时钟频率缩放数字PWM控制器的40nm CMOS低压降压DC-DC变换器。迄今为止的最高效率是在输出功率小于40μW的情况下实现的。为了补偿数字PWM控制器中延迟线的模间延迟变化,提出了一种可控性好的对数应力电压(LSV)线性延迟修整方案,并在测量中进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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