Frederico A. L. Souza, P. Pereira, H. Paula, B. Filho, A. Rocha
{"title":"Motor drive systems reliability: Impact of the environment conditions on the electronic component failure rates","authors":"Frederico A. L. Souza, P. Pereira, H. Paula, B. Filho, A. Rocha","doi":"10.1109/IAS.2014.6978463","DOIUrl":null,"url":null,"abstract":"This article discusses the actual failure rate of electronic components when these are exposed to harsh environments, which can include vibration, dust, humidity, high temperature and others. It presents a compilation on the physico-chemical effects that can take place when electronic components are stressed and how such effects can reduce the component life. It is also presented a compilation of the results of a thorough and comprehensive research on different standards for reliability prediction, along with a critical and comparative analysis between the methodologies and applications related to each one of them. Furthermore, to provide the reader a broader understanding of the methodology used in these standards, an example employing a typical SV-PWM converter used in motor drive systems, submitted to different environmental stresses, is used as a case study.","PeriodicalId":446068,"journal":{"name":"2014 IEEE Industry Application Society Annual Meeting","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Industry Application Society Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.2014.6978463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
This article discusses the actual failure rate of electronic components when these are exposed to harsh environments, which can include vibration, dust, humidity, high temperature and others. It presents a compilation on the physico-chemical effects that can take place when electronic components are stressed and how such effects can reduce the component life. It is also presented a compilation of the results of a thorough and comprehensive research on different standards for reliability prediction, along with a critical and comparative analysis between the methodologies and applications related to each one of them. Furthermore, to provide the reader a broader understanding of the methodology used in these standards, an example employing a typical SV-PWM converter used in motor drive systems, submitted to different environmental stresses, is used as a case study.