Integrating Feature Values for Key Generation in an ICmetric System

Abstract

This paper investigates the practicalities of combining values derived from measurable features of given integrated electronic circuits in order to derive a robust encryption key, a technique termed ICmetrics. Specifically the paper explores options for the precise techniques required to combine the derived feature values in order to ensure key stability. Key stability is an essential component of any encryption system but this must be combined with a guarantee of key diversity between devices.