J. Mundy, J. Noble, Constantinos Marinos, V.-D. Nguyen, Aaron J. Heller, J. Farley, A. T. Tran
{"title":"An object-oriented approach to template guided visual inspection","authors":"J. Mundy, J. Noble, Constantinos Marinos, V.-D. Nguyen, Aaron J. Heller, J. Farley, A. T. Tran","doi":"10.1109/CVPR.1992.223160","DOIUrl":null,"url":null,"abstract":"The concepts and design issues that provide the basis for the I/sup 2/F (image interpretation foundations) system are described. The I/sup 2/F system combines object-oriented design for machine vision software and constraint-based geometric modeling into a flexible and effective system for automatic template-guided visual inspection. Object-oriented design for 2-D geometry-based image analysis is discussed, and results from processing experimental X-ray data are presented.<<ETX>>","PeriodicalId":325476,"journal":{"name":"Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CVPR.1992.223160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
The concepts and design issues that provide the basis for the I/sup 2/F (image interpretation foundations) system are described. The I/sup 2/F system combines object-oriented design for machine vision software and constraint-based geometric modeling into a flexible and effective system for automatic template-guided visual inspection. Object-oriented design for 2-D geometry-based image analysis is discussed, and results from processing experimental X-ray data are presented.<>