Joint probability distribution of power delay profiles based on 28 GHz channel measurements

Abstract

Millimeter-wave has come into the spot-light as the frequency band of the next generation communication systems. Prior to millimeter-wave communication system designs, the study of propagation characteristics is necessary. Especially, the power delay profile is one of the most important characteristics of channel fading that can be utilized for determining symbol duration. For the reason, we analyzed the root mean square (RMS) delay spread from measurements and the joint distribution of power delay profiles based on the modified Suzuki model. We found that the standard deviation of multi-path power distribution is highly correlated to the mean of the power distribution.