Gabriel Fellner, A. Pak, Seyed Mostafa Mousavi, Christoph Koger, A. khorrami, D. Pommerenke
{"title":"Quantification of ESD Pulses Caused by Collision of Objects","authors":"Gabriel Fellner, A. Pak, Seyed Mostafa Mousavi, Christoph Koger, A. khorrami, D. Pommerenke","doi":"10.1109/EMCEurope51680.2022.9901123","DOIUrl":null,"url":null,"abstract":"Well-insulated portable devices are exposed to field coupled impulsive ESDs if they are carried e.g., in a backpack. These pulses are created by tribo-charging of metallic objects as a result of movement and subsequent discharges. Due to the size of the metallic objects and low charge voltages, the frequency spectrum exceeds 5 GHz. The pulses can damage or upset devices. The paper quantifies the charge voltages and transient field strength by reproducing typical scenario and capturing transient fields with a bandwidth of more than 10 GHz. The charge voltages are estimated by comparing measurements to numerical modeling of the discharges.","PeriodicalId":268262,"journal":{"name":"2022 International Symposium on Electromagnetic Compatibility – EMC Europe","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Symposium on Electromagnetic Compatibility – EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEurope51680.2022.9901123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Well-insulated portable devices are exposed to field coupled impulsive ESDs if they are carried e.g., in a backpack. These pulses are created by tribo-charging of metallic objects as a result of movement and subsequent discharges. Due to the size of the metallic objects and low charge voltages, the frequency spectrum exceeds 5 GHz. The pulses can damage or upset devices. The paper quantifies the charge voltages and transient field strength by reproducing typical scenario and capturing transient fields with a bandwidth of more than 10 GHz. The charge voltages are estimated by comparing measurements to numerical modeling of the discharges.