{"title":"Lightning Surge Test Circuit Design Method for Telecommunication Equipment","authors":"Tamio Motomitsu, T. Ideguchi, Hisaaki Kanamori","doi":"10.1109/ISEMC.1987.7570742","DOIUrl":null,"url":null,"abstract":"This paper proposes a lightning surge test circuit for estimating the resistibility of equipment against lightning surges. Lightning surge voltages appear on telecommunication lines and reach terminal equipment and can cause significant damage. A simple lightning surge test circuit composed of a small number of circuit elements is proposed. The circuit element design method simulates lightning surge fed into equipment. A circuit design example is shown and it is shown that the simulating error is less than 30%.","PeriodicalId":443616,"journal":{"name":"1987 IEEE International Symposium on Electromagnetic Compatibility","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1987 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1987.7570742","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper proposes a lightning surge test circuit for estimating the resistibility of equipment against lightning surges. Lightning surge voltages appear on telecommunication lines and reach terminal equipment and can cause significant damage. A simple lightning surge test circuit composed of a small number of circuit elements is proposed. The circuit element design method simulates lightning surge fed into equipment. A circuit design example is shown and it is shown that the simulating error is less than 30%.