Fabrication Process Of A Capacitive Microphone With p++ Diaphragm And Silicon Bonded Top-Plate

C. Iliescu, Tietun Sun, J. Miao, F. Tay
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Abstract

This paper purposes a very simple and reliable fabrication process foar a silicon capacitive microphone, the two electrodes of the condenser microphone are: a thin p++ silicon membrane fabricated using an optimized diffusion process, and a thick -30 μm - top electrode, processed also on a silicon wafer. Isolating and metal layers assure the gap between those two eletrodes. The bonding between electrode's wafers is performed using an Au-Si eutectic wafer-to-wafer bonding techniques. The thinning of top-electrode was made in the same step of the process as the etching of silicon diaphragm. The concept of fabrication process was to avoid the sticking of thin diaphragm to top electrode during different wet process. Different design with different size of diaphragm was fabricated using this process. The resulting capacitance was in the range of 1.85-3.5 pF.
p++膜片与硅粘接顶板电容式传声器的制造工艺
本文提出了一种非常简单可靠的硅电容式传声器的制造工艺,电容式传声器的两个电极是:采用优化扩散工艺制备的p++薄硅膜和同样在硅片上加工的-30 μm厚电极。隔离层和金属层保证了两个电极之间的间隙。电极晶片之间的键合是使用金硅共晶晶片对晶片键合技术进行的。顶电极的减薄与硅膜片的蚀刻在同一步骤进行。制造工艺的概念是为了避免在不同的湿法过程中薄隔膜粘在上电极上。采用该工艺制备了不同尺寸、不同设计的膜片。所得电容在1.85-3.5 pF范围内。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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