High intracavity power thin-disk lasers for continuous-wave strong alignment of molecules

B. Deppe, G. Huber, C. Krãnkel, J. Kupper
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Abstract

Many experiments aiming at recording the “molecular movie”, i.e., the imaging of the structural dynamics of chemical processes, rely on molecules fixed-in-space. One of the most promising approaches to capture such processes is time-resolved x-ray-diffractive imaging. Modern x-ray light sources, such as the upcoming free-electron lasers with very large photon fluxes such as the European XFEL, LCLS II, or synchrotrons, operate at high repetition rates with ten-thousands to millions of pulses per second, sometimes in burst modes. To allow for efficient measurements, the aligned molecules should be available for all of these pulses. However, the necessary electric field strengths for strong adiabatic alignment of gas-phase ensembles of molecules exceeds 1010 W/cm2 and this field strength must be applied over durations comparable to the rotation periods of the molecules of hundreds of picoseconds to even nanoseconds. So far, these intensities are only available from pulsed amplifier systems with repetition rates in the few-Hz to low-kHz range, which does not allow for providing aligned molecules for all pulses of the x-ray probe sources. Thus, it prohibits efficient use of these sources.
用于分子连续波强排列的高腔内功率薄盘激光器
许多旨在记录“分子电影”的实验,即化学过程结构动力学的成像,都依赖于固定在空间中的分子。捕捉这种过程的最有希望的方法之一是时间分辨x射线衍射成像。现代x射线光源,如即将问世的具有非常大光子通量的自由电子激光器,如欧洲的XFEL、LCLS II或同步加速器,以每秒一万到数百万脉冲的高重复率运行,有时以爆发模式运行。为了进行有效的测量,排列的分子应该对所有这些脉冲都可用。然而,气相分子的强绝热排列所需的电场强度超过1010w /cm2,并且该电场强度必须在与数百皮秒甚至纳秒的分子旋转周期相当的持续时间内施加。到目前为止,这些强度只能从重复频率在几赫兹到低千赫范围内的脉冲放大器系统中获得,这并不允许为x射线探针源的所有脉冲提供对齐的分子。因此,它阻碍了这些资源的有效利用。
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