{"title":"Microwave Trapped Plasma Devices Observed on a 35 GHz Sampling Oscilloscope","authors":"J. Carroll, J. Everard","doi":"10.1109/EUMA.1979.332764","DOIUrl":null,"url":null,"abstract":"Optoelectronic switches have been built to generate and sample 100 volt pulses in 10 ps. This gives a unique opportunity to observe avalanche processes in X-band Trapatt diodes which are driven well above breakdown. The expected behaviour of such Trapatt diodes in a resistive npn-oscillatory circuit is reviewed for a step voltage drive and also for an optical pulse input. It is concluded that 10 ps switches are essential to provide a sufficiently fast ramp voltage to initiate the trapped plasma and to sample adequately the subsequent collapse of voltage across the diode. Progress in this technique of optoelectronic sampling is reviewed.","PeriodicalId":128931,"journal":{"name":"1979 9th European Microwave Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1979 9th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1979.332764","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Optoelectronic switches have been built to generate and sample 100 volt pulses in 10 ps. This gives a unique opportunity to observe avalanche processes in X-band Trapatt diodes which are driven well above breakdown. The expected behaviour of such Trapatt diodes in a resistive npn-oscillatory circuit is reviewed for a step voltage drive and also for an optical pulse input. It is concluded that 10 ps switches are essential to provide a sufficiently fast ramp voltage to initiate the trapped plasma and to sample adequately the subsequent collapse of voltage across the diode. Progress in this technique of optoelectronic sampling is reviewed.