W. Mikhael, Abdullah Eroglu, Liang Chen, G. Záruba, C.-C. Jay Kuo
{"title":"Program Committee","authors":"W. Mikhael, Abdullah Eroglu, Liang Chen, G. Záruba, C.-C. Jay Kuo","doi":"10.1109/SEFM.2005.36","DOIUrl":null,"url":null,"abstract":"Jun Ai, Beihang University, China Doo-Hwan Bae, Korea Advanced Institute of Science and Technology, Korea Mark Bentsen, Argo Data, USA Lon Chase, IEEE Reliability Society, USA Yixiang Chen, East China Normal University, China Zhenyu Chen, Nanjing University, China Byoungju Choi, Ewha Womans University, Korea William Chu, Tunghai University, Taiwan Sunita Chulani, Cisco, USA Vidroha Debroy, AT&T (USA), USA Junhua Ding, University of North Texas, USA Tadashi Dohi, Hiroshima University, Japan Jian Dong, Harbin Institute of Technology, China Wei Dong, National University of Defense Technology, China Yunwei Dong, Northwestern Polytechnical University, China Lance Fiondella, University of Massachusetts Dartmouth, USA Ruizhi Gao, Sonos Inc., USA Bing Guo, Sichuan University, China Tom Hill, The Fellows Consulting Group, USA Birgit Hofer, Graz University of Technology, Austria Chin-Yu Huang, National Tsing Hua University, Taiwan Zhao Ji, Guangdong Ocean University, China Chuan Li, Chongqing Technology and Business University, China Jenny Li, Kean University, USA Steve Li, Western New England University, USA Yihao Li, Graz University of Technology, Austria Yun Lin, Harbin Engineering University, China Shaoying Liu, Hiroshima University, Japan José Maldonado, University of São Paulo, Brazil Nick Multari, Pacific Northwest National Laboratory, USA Manuel Nuñez, Universidad Complutense de Madrid, Spain Pete Rotella, Cisco, USA Mike Siok, University of Texas at Arlington, USA Hongwei Tao, Zhengzhou University of Light Industry, China Nguyen Tien, University of Texas at Dallas, USA Tugkan Tuglular, Izmir Institute of Technology, Turkey Auri Vincenzi, Federal University of São Carlos, Brazil Jian Wang, Chinese Academy of Sciences, China Yong Wang, Anhui University of Engineering, China Ziyuan Wang, Nanjing University of Posts and Telecommunications, China Franz Wotawa, Graz University of Technology, Austria Qinggang Wu, Zhengzhou University of Light Industry, China Jianwen Xiang, Wuhan University of Technology, China Dianxing Xu, University of Missouri Kansas City, USA Han Xu, Huawei Company, China Hongji Yang, University of Leicester, UK","PeriodicalId":413697,"journal":{"name":"2021 18th Conference on Robots and Vision (CRV)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 18th Conference on Robots and Vision (CRV)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SEFM.2005.36","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Jun Ai, Beihang University, China Doo-Hwan Bae, Korea Advanced Institute of Science and Technology, Korea Mark Bentsen, Argo Data, USA Lon Chase, IEEE Reliability Society, USA Yixiang Chen, East China Normal University, China Zhenyu Chen, Nanjing University, China Byoungju Choi, Ewha Womans University, Korea William Chu, Tunghai University, Taiwan Sunita Chulani, Cisco, USA Vidroha Debroy, AT&T (USA), USA Junhua Ding, University of North Texas, USA Tadashi Dohi, Hiroshima University, Japan Jian Dong, Harbin Institute of Technology, China Wei Dong, National University of Defense Technology, China Yunwei Dong, Northwestern Polytechnical University, China Lance Fiondella, University of Massachusetts Dartmouth, USA Ruizhi Gao, Sonos Inc., USA Bing Guo, Sichuan University, China Tom Hill, The Fellows Consulting Group, USA Birgit Hofer, Graz University of Technology, Austria Chin-Yu Huang, National Tsing Hua University, Taiwan Zhao Ji, Guangdong Ocean University, China Chuan Li, Chongqing Technology and Business University, China Jenny Li, Kean University, USA Steve Li, Western New England University, USA Yihao Li, Graz University of Technology, Austria Yun Lin, Harbin Engineering University, China Shaoying Liu, Hiroshima University, Japan José Maldonado, University of São Paulo, Brazil Nick Multari, Pacific Northwest National Laboratory, USA Manuel Nuñez, Universidad Complutense de Madrid, Spain Pete Rotella, Cisco, USA Mike Siok, University of Texas at Arlington, USA Hongwei Tao, Zhengzhou University of Light Industry, China Nguyen Tien, University of Texas at Dallas, USA Tugkan Tuglular, Izmir Institute of Technology, Turkey Auri Vincenzi, Federal University of São Carlos, Brazil Jian Wang, Chinese Academy of Sciences, China Yong Wang, Anhui University of Engineering, China Ziyuan Wang, Nanjing University of Posts and Telecommunications, China Franz Wotawa, Graz University of Technology, Austria Qinggang Wu, Zhengzhou University of Light Industry, China Jianwen Xiang, Wuhan University of Technology, China Dianxing Xu, University of Missouri Kansas City, USA Han Xu, Huawei Company, China Hongji Yang, University of Leicester, UK