Test Considerations about the Structured ASIC Paradigm

2006 IEEE Design and Diagnostics of Electronic Circuits and systems Pub Date : 2006-04-18 DOI:10.1109/DDECS.2006.1649622

P. Bernardi, M. Grosso

引用次数: 2

Abstract

We present a survey on the academic and industrial structured ASIC practices, especially focusing on the test strategies currently in use. Then, we compare two possible test generation flows, underlining the most critical aspects introduced by the adoption of the structured ASIC methodology

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关于结构化ASIC范例的测试考虑

我们对学术和工业结构化ASIC实践进行了调查，特别关注当前使用的测试策略。然后，我们比较了两种可能的测试生成流程，强调了采用结构化ASIC方法引入的最关键的方面

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2006 IEEE Design and Diagnostics of Electronic Circuits and systems

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