Simultaneous Measurements of Angle of Arrival and Doppler Frequency Shift Based on Silicon Modulators

Sihan Chen, Qiang Zhang, Jingyang Fan, Xingyi Jiang, Shu‐Yuan Zhang, Hui Yu
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Abstract

We experimentally demonstrate the simultaneous measurements of the microwave angle of arrival and Doppler frequency shift by silicon modulators. The measurement errors of AOA and DFS are less than 3° and 7.2×10-10 Hz at 30 GHz, respectively.
基于硅调制器的到达角和多普勒频移的同时测量
实验证明了用硅调制器同时测量微波到达角和多普勒频移。在30 GHz时,AOA和DFS的测量误差分别小于3°和7.2×10-10 Hz。
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