An IoT inspired semiconductor Reliability test system integrated with data-mining applications

Abstract

Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.