An automatic testbench generation tool for a systemC functional verification methodology

Karina R. G. da Silva, E. Melcher, G. Araújo, Valdiney Alves Pimenta
{"title":"An automatic testbench generation tool for a systemC functional verification methodology","authors":"Karina R. G. da Silva, E. Melcher, G. Araújo, Valdiney Alves Pimenta","doi":"10.1145/1016568.1016592","DOIUrl":null,"url":null,"abstract":"The advent of new 90 nm/130 nm VLSI technology and SoC design methodologies, has brought an explosive growth in the complexity of modern electronic circuits. As a result, functional verification has become the major bottleneck in any design flow. New methods are required that allow for easier, quicker and more reusable verification. In this paper we propose an automatic verification methodology approach that enables fast, transaction-level, coverage-driven, self-checking and random-constraint functional verification. Our approach uses the systemC verification library (SCV), to synthesize a tool capable of automatically generating testbench templates. A case study from a real MP3 design is used to show the effectiveness of our approach.","PeriodicalId":275811,"journal":{"name":"Proceedings. SBCCI 2004. 17th Symposium on Integrated Circuits and Systems Design (IEEE Cat. No.04TH8784)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. SBCCI 2004. 17th Symposium on Integrated Circuits and Systems Design (IEEE Cat. No.04TH8784)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1016568.1016592","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 42

Abstract

The advent of new 90 nm/130 nm VLSI technology and SoC design methodologies, has brought an explosive growth in the complexity of modern electronic circuits. As a result, functional verification has become the major bottleneck in any design flow. New methods are required that allow for easier, quicker and more reusable verification. In this paper we propose an automatic verification methodology approach that enables fast, transaction-level, coverage-driven, self-checking and random-constraint functional verification. Our approach uses the systemC verification library (SCV), to synthesize a tool capable of automatically generating testbench templates. A case study from a real MP3 design is used to show the effectiveness of our approach.
用于系统功能验证方法的自动测试台架生成工具
新的90纳米/130纳米VLSI技术和SoC设计方法的出现,带来了现代电子电路复杂性的爆炸式增长。因此,功能验证已成为任何设计流程中的主要瓶颈。需要新的方法来允许更容易、更快和更可重用的验证。在本文中,我们提出了一种自动验证方法,该方法可以实现快速、事务级、覆盖驱动、自检和随机约束的功能验证。我们的方法使用systemC验证库(SCV)来合成一个能够自动生成测试台架模板的工具。通过一个实际的MP3设计案例,验证了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信