{"title":"The structural evolution of CGS thin film during three-stage deposition process","authors":"H. Al-Thani, F. Hasoon","doi":"10.1109/PVSC.2009.5411677","DOIUrl":null,"url":null,"abstract":"CGS thin films were deposited on Molybdenum coated soda lime glass (Mo/SLG) substrates, using physical vapor deposition (PVD) 3-stage process. In order to study the evolution of the CGS growth process and the Na out-diffusion in the CGS films from SLG substrates, the structural phase transitions were traced in the CGS films indicated by multiple exothermic reactions that occur during the growth process. The CGS films' structure was examined and the films' growth phase was identified by applying θ/2θ X-Ray Diffraction characterization technique. Secondary-ion mass spectrometry (SIMS) was also applied to depth profile the Na in the CGS/Mo/SLG films.","PeriodicalId":411472,"journal":{"name":"2009 34th IEEE Photovoltaic Specialists Conference (PVSC)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 34th IEEE Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2009.5411677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
CGS thin films were deposited on Molybdenum coated soda lime glass (Mo/SLG) substrates, using physical vapor deposition (PVD) 3-stage process. In order to study the evolution of the CGS growth process and the Na out-diffusion in the CGS films from SLG substrates, the structural phase transitions were traced in the CGS films indicated by multiple exothermic reactions that occur during the growth process. The CGS films' structure was examined and the films' growth phase was identified by applying θ/2θ X-Ray Diffraction characterization technique. Secondary-ion mass spectrometry (SIMS) was also applied to depth profile the Na in the CGS/Mo/SLG films.