Area optimization of comparator layout design by using Cadence Virtuoso tools in 45 nanometer process technology

Michelle Ang Syn Yi, R. Hussin, N. Ahmad, F. Rokhani
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Abstract

This paper presents the area optimization of comparator layout design. Nowadays, technology is continuously developing to improve the quality of human’s life. Electronic devices tend to design in smaller size, lower cost and higher performance. Therefore, layout design plays an important role to design the electronic devices in smaller size, lower cost, and higher performance. This is because when the layout size decreases, the number of chips can be produced by one semiconductor wafer increases and the cost of integrated circuits chip decreases. This project implements the techniques to optimize the area comparator layout which are diffusion sharing, legging and flip the sub-cells by using Cadence Virtuoso tools in 45 nanometer process technology. Based on the result, the total area optimization of comparator layout by comparison the area that given when generated layout from schematic with the area of finalize layout is 67.10%.
利用Cadence Virtuoso工具进行45纳米工艺比较器布局设计的面积优化
本文提出了比较器布局设计的面积优化方法。如今,科技不断发展,以提高人类的生活质量。电子器件的设计趋向于更小的尺寸、更低的成本和更高的性能。因此,版图设计对于设计更小尺寸、更低成本、更高性能的电子器件起着重要的作用。这是因为当布局尺寸减小时,一个半导体晶圆可以生产的芯片数量增加,集成电路芯片的成本降低。本课题利用Cadence Virtuoso工具在45纳米工艺中实现了扩散共享、legging和翻转子单元等优化面积比较器布局的技术。在此基础上,通过对比原理图生成布局时给出的面积与最终布局的面积,比较器布局的总优化面积为67.10%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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