{"title":"The reliability of the optical disk cluster drive","authors":"K. Tanaka","doi":"10.1117/12.399353","DOIUrl":null,"url":null,"abstract":"Optical disk cluster drive is a promising candidate for storing large volume data. The delay of writing caused by defect management can be eliminated by cluster ECC code. The bit error rate achieved by cluster ECC is better than that attained by defect management. Non stop operation was studied.","PeriodicalId":215485,"journal":{"name":"2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Optical Data Storage. Conference Digest (Cat. No.00TH8491)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.399353","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Optical disk cluster drive is a promising candidate for storing large volume data. The delay of writing caused by defect management can be eliminated by cluster ECC code. The bit error rate achieved by cluster ECC is better than that attained by defect management. Non stop operation was studied.