Unique features of electronic device testing using NI-technologies

2015 International Siberian Conference on Control and Communications (SIBCON) Pub Date : 2015-07-02 DOI:10.1109/SIBCON.2015.7147314

V. Butin, A. Butina, F. Chubrukov

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引用次数: 0

Abstract

The paper describes methodological problems of functional check and parametric testing of electronic devices by using modular NI PXI-devices in various environmental conditions.The operation algorithm of developed automated test system can analyze the time measurement of various parameters; it synchronizes time between measurements, creates experimental data back-ups and minimizes measurement time. The log-file allows detecting the sequence of errors during the functional check of electronic device. The interface module controls the data exchange by multiplex channel and it is integrated in automated test system. The application-dependent software provides the remote parameters measurement and research control. The control program realizes the switching of the device power supply to external power source in case of the control parameters exceeding the limits. The developed test system has been approbated at modeling and simulation facilities of ROSATOM companies such as FSUE VNIIA (Moscow, Russia), FSUE RISI (Lytkarino, Russia) and SSC RF - IPPE (Obninsk, Russia).

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使用ni技术进行电子设备测试的独特功能

本文介绍了利用模块化NI pxi器件在各种环境条件下进行电子器件功能检查和参数测试的方法问题。所开发的自动化测试系统的操作算法可以对各种参数的时间测量进行分析;它在测量之间同步时间，创建实验数据备份，并最大限度地减少测量时间。日志文件允许在电子设备的功能检查期间检测错误的顺序。接口模块通过多路通道控制数据交换，并集成到自动化测试系统中。应用相关软件提供远程参数测量和研究控制。控制程序实现了在控制参数超出限制时将设备电源切换到外部电源。开发的测试系统已在ROSATOM公司的建模和仿真设施中得到认可，例如FSUE VNIIA(俄罗斯莫斯科)，FSUE RISI(俄罗斯利特卡里诺)和SSC RF - IPPE(俄罗斯奥布宁斯克)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2015 International Siberian Conference on Control and Communications (SIBCON)

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