Semiconductor Photodetectors

V. Igor
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Abstract

This chapter describes the operating principles of photoconductive and photovoltaic detectors based on III–V semiconductors. The electrical characteristics of both photodiodes and majority carrier barrier structures are discussed starting with the diffusion equation. The chapter outlines the figures of merit used to evaluate the performance of infrared photodetectors including the responsivity, dark current density, and normalized detectivity. It discusses bulk-like and type II superlattice photodetectors and how the multistage arrangement of interband cascade detectors (ICDs) can reduce the dark current density at the expense of a lower responsivity. Detectors that employ intersubband optical transitions, namely, quantum-well infrared photodetectors and quantum cascade detectors, are also discussed. The chapter considers how the dark-current density can be suppressed in resonant-cavity and thin waveguide-based detectors. It concludes with a discussion of the requirements for high-speed operation and an overview of novel types of detectors that draw their inspiration from III–V semiconductor devices.
半导体光电探测器
介绍基于III-V型半导体的光导光电探测器的工作原理。从扩散方程出发,讨论了光电二极管和多数载流子势垒结构的电学特性。本章概述了用于评价红外光电探测器性能的指标,包括响应率、暗电流密度和归一化探测率。讨论了体状和II型超晶格光电探测器,以及带间级联探测器(ICDs)的多级排列如何以较低的响应率为代价降低暗电流密度。本文还讨论了采用子带间光跃迁的探测器,即量子阱红外探测器和量子级联探测器。本章考虑了如何在谐振腔和薄波导探测器中抑制暗电流密度。最后讨论了高速运行的要求,并概述了从III-V半导体器件中汲取灵感的新型探测器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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