TASEP model with a single defect coupling on-ramp

Abstract

In this paper, we studied the effect of a single defect coupling on-ramp by applying a totally asymmetric simple exclusion process model (TASEP). Both theoretical and simulative methods are employed to analyze the changes of the phase diagrams with the hopping rate $p$ at the defect site and the on-ramp rate $q$. The results demonstrate that a new steady phase (high density/low density, HD/LD) and the phase diagram can be in the system under the special relationship between the hopping rate $p$ and the on-ramp $q$. We can make the probability of traffic jam occurring reach the lowest through controlling the relationship between $p$ and $q$.