A. Frank, D. Maas, J. V. Mechelen
{"title":"Reliable In-situ Thickness Monitoring of Multilayer Paints Based on THz Time Domain Spectroscopy","authors":"A. Frank, D. Maas, J. V. Mechelen","doi":"10.1364/AIO.2019.W4A.2","DOIUrl":null,"url":null,"abstract":"We present a femtosecond laser-based THz paint analyzer for measuring wet and dry paint multilayers insensitive to surface curvatures and vibrations. Multiple layers can be measured simultaneously with an average error smaller than 1.1 µm. © 2019 The Author(s)","PeriodicalId":446858,"journal":{"name":"Applied Industrial Optics 2019","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Industrial Optics 2019","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/AIO.2019.W4A.2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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