A conceptual simulation framework for the performance assessment of lot release policies

Abstract

This paper presents a conceptual simulation framework (CSF) for the assessment of lot release policies on selected performance metrics, such as cycle time, WIP level and throughput rate. The development of a CSF is derived from the analysis of the semiconductor wafer fabrication, which is perhaps one of the most complex manufacturing processes found today. Due to economic efficiency and increased complexity, simulation emerges as a powerful technique that can capture and analyse such complex systems. The CSF which is developed here is expected to improve the productivity of simulation analyses and furthermore, it reduces the preparing time for input data and errors.