Texture Analysis by theMeasurement of IndividualGrain Orientations—Electron Microscopical Methods and Application on Dual-Phase Steel

R. Schwarzer, H. Weiland
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引用次数: 17

Abstract

A short review is given on electron microscopical methods for the determination of local textures. Electron microscopy offers the unique facility of diffraction from well defined locations in the sample and high resolution imaging of the microstructure. Standard techniques of orientation determination are the evaluation of electron diffraction spot and—more recently—Kikuchi patterns, which are applicable to electron transparent fine-grain materials. Specimen areas smaller than 500 nm or 50 nm in diameter, respectively, can be selected. Bulk samples with crystallite sizes greater than approximately 1 μm or 5 μm, respectively, can be studied with the SEM using electron backscattering or channelling patterns. For routine work a program has been developed to do on-line determination of orientation of cubic, orthorhombic or hexagonal crystals from Kikuchi, channelling and backscattering patterns.Applications of this technique on dual-phase steel are given. The orientation distribution functions (ODF) of the ferrite and martensite phases from individual grain measurements are compared with X-ray and neutron pole-figure measurements. Misorientation distribution functions (MODF) are discussed for contiguous ferrite-martensite and martensite-martensite grains.
单晶取向测量的织构分析——电子显微方法及其在双相钢上的应用
本文简要介绍了用电子显微镜测定局部织构的方法。电子显微镜提供了独特的衍射设备,从样品中明确的位置和高分辨率的微观结构成像。取向测定的标准技术是评价电子衍射斑和最近的评价菊池图案,它们适用于电子透明细粒材料。可选择直径分别小于500nm或50nm的试样区域。晶体尺寸分别大于1 μm和5 μm的样品可以通过电子后向散射或通道模式进行扫描电镜研究。对于日常工作,我们开发了一个程序来在线测定立方、正交或六方晶体的定向,从Kikuchi,通道和后向散射模式。介绍了该技术在双相钢上的应用。将单晶铁素体和马氏体相的取向分布函数(ODF)与x射线和中子极图测量结果进行了比较。讨论了连续铁素体-马氏体晶粒和马氏体-马氏体晶粒的错取向分布函数(MODF)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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