Analysis of different transparent conductive thin films element on monocrystalline silicon cell

Abstract

An analysis of phase response from different types of transparent conductive thin film is presented in this paper. Surface current performance of each film which was shaped with triangular loop shape is then investigated. It has been demonstrated from the CST simulated results that element of Kapton film exhibits the best scattering parameter performance with bandwidth over 15% and linear phase range over 360°.