Reducing RMS noise in CMOS dynamic reconfigurable latched comparator in 50 nm

M. Kumar, Manish Singhal
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Abstract

This paper presents a new dynamic reconfigurable CMOS latched comparator that demonstrates low RMS noise, low offset and high gain. In this dynamic comparator circuit we make an independent inputs transistor and its input inverter circuit PMOS connected to clk1 with tail transistor. The proposed comparator circuit shows better RMS noise response i.e. 704.38μV as compare to previous comparator circuit i.e. 1.1208mV and better output driving capacity as compare to conventional comparator circuit. The proposed comparator is simulated and implemented in LT SPICE 50nm technology.
50nm CMOS动态可重构锁存比较器RMS噪声的降低
本文提出了一种新的动态可重构CMOS锁存比较器,具有低均方根噪声、低偏置和高增益的特点。在这个动态比较器电路中,我们制作了一个独立的输入晶体管和它的输入逆变电路PMOS连接到带有尾晶体管的clk1。该比较器电路的RMS噪声响应为704.38μV,优于先前比较器电路的1.1208mV;输出驱动能力优于传统比较器电路。所提出的比较器在LT SPICE 50nm技术下进行了仿真和实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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