Ellen H. Rumley, Philipp Rothemund, Steven Zhang, N. Kellaris, C. Keplinger
{"title":"Characterization of charge retention effects in HASEL actuators","authors":"Ellen H. Rumley, Philipp Rothemund, Steven Zhang, N. Kellaris, C. Keplinger","doi":"10.1117/12.2612817","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":218872,"journal":{"name":"Electroactive Polymer Actuators and Devices (EAPAD) XXIV","volume":"9 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electroactive Polymer Actuators and Devices (EAPAD) XXIV","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2612817","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}