Combining yield optimization with circuit level electromagnetic simulation (MMIC design)

1992 IEEE Microwave Symposium Digest MTT-S Pub Date : 1992-06-01 DOI:10.1109/MWSYM.1992.188288

M. Meehan, P. Draxler, L.C. Henning

引用次数: 0

Abstract

A method for first-pass MMIC (monolithic microwave integrated circuit) design success is presented. The power of statistical design and modeling is combined with that of circuit-level electromagnetic simulation in a CAD (computer-aided-design) system, providing the ultimate means for predicting production success. The performance of the proposed CAD system is verified by comparing simulated and actual statistical response characteristics of a three-stage, 7-11-GHz low-noise-amplifier GaAs MMIC.<>

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成品率优化与电路级电磁仿真(MMIC设计)的结合

提出了一种单片微波集成电路首通设计成功的方法。在CAD(计算机辅助设计)系统中，统计设计和建模的力量与电路级电磁仿真的力量相结合，为预测生产成功提供了最终手段。通过比较一个三级7-11 ghz低噪声放大器GaAs MMIC的仿真响应特性和实际统计响应特性，验证了所提出的CAD系统的性能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1992 IEEE Microwave Symposium Digest MTT-S

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