PSP-SOI: A Surface Potential Based Compact Model of Partially Depleted SOI MOSFETs

Weimin Wu, Xin Li, G. Gildenblat, G. Workman, S. Veeraraghavan, C. McAndrew, R. V. Langevelde, G. Smit, A. Scholten, D. Klaassen, J. Watts
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引用次数: 23

Abstract

This paper reports recent progress on partially depleted (PD) SOI modeling using a surface potential based approach. The new model, called PSP-SOI, is formulated within the framework of the latest industry standard bulk MOSFET model PSP. In addition to its physics-based formulation and scalability inherited from PSP, PSP-SOI captures SOI specific effects by including a floating body simulation capability, a parasitic bipolar model, and self-heating. A nonlinear body resistance is included for modeling body-contacted SOI devices. The PSP-SOI model has been extensively tested on several PD/SOI technologies.
基于表面电位的部分耗尽SOI mosfet紧凑模型
本文报道了利用基于表面电位的方法进行部分枯竭(PD) SOI建模的最新进展。新模型称为PSP- soi,是在最新的行业标准批量MOSFET模型PSP的框架内制定的。除了基于物理的配方和继承自PSP的可扩展性外,PSP-SOI还通过包括浮动体模拟功能、寄生双极模型和自加热功能来捕获SOI特定效果。非线性体电阻包括建模体接触SOI器件。PSP-SOI模型已经在几种PD/SOI技术上进行了广泛的测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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