An Ultra-Portable X-Pinch for Probing Warm Dense Matter

Abstract

Determining the properties of Warm Dense Matter (WDM) necessitates the use of advanced X-ray based diagnostics including diffraction and absorption spectrometry. As many experiments that produce WDM do so for only a few ns, the probing X-rays must be short pulsed, ideally with a high enough yield to produce data on a single experiment. They must also have the correct spectral characteristics – e.g. having a smooth continuum for absorption spectrometry. Such requirements often restrict experiments to large scale facilities like 3rd generation Synchrotrons and XFELs, which have exemplary capabilities, but can also have very limited time available for individual users.