{"title":"Low-Cost CMOS Process with Complete Post-Gate Implantation Scheme","authors":"M. Kerber, U. Schwalke, R. Heinrich","doi":"10.1109/ESSDERC.1997.194450","DOIUrl":null,"url":null,"abstract":"A low cost CMOS process flow is proposed which unifies all implantations to form NMOS and PMOS devices in a single mask step for each transistor type. This reduces the total mask count by three and hence cost and processing time accordingly. Experimental results demonstrate electrical performance comparable to conventional CMOS technologies.","PeriodicalId":424167,"journal":{"name":"27th European Solid-State Device Research Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.1997.194450","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A low cost CMOS process flow is proposed which unifies all implantations to form NMOS and PMOS devices in a single mask step for each transistor type. This reduces the total mask count by three and hence cost and processing time accordingly. Experimental results demonstrate electrical performance comparable to conventional CMOS technologies.