Multi-frequency validation algorithm for measurement and analysis of Dielectric Losses for Power and Distribution Transformers

D. Robalino, L. Sosa
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Abstract

In this work, the authors focus on a highly-practical testing procedure bringing two main benefits to all power industry operators: a) higher confidence on the evaluation of dielectric testing, and; b) better utilization of technical and human resources. In the field, the application of dissipation factor measurements at (typically) 10 kV and at line-frequency (50 or 60 Hz) has been in use for many years without significant changes to the method. Nevertheless, multifrequency measurement of dielectric losses has opened a wider spectrum of analysis for power, distribution transformers and bushings. It is missing though, in the literature, a clear and properly supported discussion about how and when a single frequency measurement is validated with a multifrequency measurement or completely challenged. Important to recognize the link between line-frequency measurement, narrowband measurement (1 – 505 Hz) and full spectrum dielectric response (typically 1 kHz – 1 mHz). Limited information obtained in the frequency domain may identify a faulty unit but may not be used as a preventative test to minimize risk of failure. Preliminary research does address the need for limits of narrowband measurements. This is only possible when a correlation is established between temperature and frequency as it has been done using the well-known Arrhenius correlation. Therefore, in this work, the analysis of the dielectric response at frequencies beyond line-frequency leads to the undeniable benefit of using a multi-frequency dielectric loss procedure to establish higher confidence at the time to state not only technical but also financial decisions.
电力和配电变压器介质损耗测量与分析的多频验证算法
在这项工作中,作者专注于一个高度实用的测试程序,为所有电力行业运营商带来两个主要好处:a)对介电测试评估的更高信心;B)更好地利用技术和人力资源。在现场,耗散系数测量(通常)在10kv和线频(50或60 Hz)下的应用已经使用多年,方法没有重大变化。然而,介质损耗的多频率测量为电力、配电变压器和套管的分析开辟了更广泛的范围。然而,在文献中,缺少关于如何以及何时使用多频测量验证单频测量或完全挑战的清晰和适当支持的讨论。重要的是要认识到线频测量,窄带测量(1 - 505 Hz)和全频谱介电响应(通常为1 kHz - 1 mHz)之间的联系。在频域中获得的有限信息可以识别出有故障的单元,但不能用作预防性测试,以尽量减少故障风险。初步研究确实解决了窄带测量限制的需要。这只有在温度和频率之间建立起相关性时才有可能,就像用著名的阿伦尼乌斯相关性所做的那样。因此,在这项工作中,对线频以外频率的介电响应的分析带来了不可否认的好处,即使用多频率介电损耗程序在陈述技术和财务决策时建立更高的置信度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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