A Low-Cost Test Bench for the Characterization of Microwave Devices Using Modulated Envelope Signal

Abstract

Thirst for efficient design and modeling of nonlinear microwave devices require accurate characterization of devices in the presence of modulated signals. Vector network analyzer, which is used for such characterization is a costly tool. This paper presents a low-cost test bed, which can characterize the microwave devices in the presence of wideband 4G/5G signals for the measurement of harmonics as well as in-band characteristics. Example case for the second harmonic along with the fundamental signal characterization has been reported.