To Float Or Not To Float - Negative Supply Diagnostics For Gate Drivers

I. Hurez, Ki-Nam Song, Andrei Enache, V. Anghel, G. Brezeanu
{"title":"To Float Or Not To Float - Negative Supply Diagnostics For Gate Drivers","authors":"I. Hurez, Ki-Nam Song, Andrei Enache, V. Anghel, G. Brezeanu","doi":"10.1109/CAS56377.2022.9934311","DOIUrl":null,"url":null,"abstract":"This paper presents an architecture for detecting the floating status of the negative power supply pin of gate drivers. The architecture monitors the negative supply voltage and compares it to an internal reference based on a diode voltage drop. This technique compensates the temperature variation of the negative power supply floating voltage. The proposed architecture was implemented as part of a galvanically isolated gate driver in a standard 0.25μ m BCD technology. Simulation and experimental results validate the proper functionality.","PeriodicalId":380138,"journal":{"name":"2022 International Semiconductor Conference (CAS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAS56377.2022.9934311","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper presents an architecture for detecting the floating status of the negative power supply pin of gate drivers. The architecture monitors the negative supply voltage and compares it to an internal reference based on a diode voltage drop. This technique compensates the temperature variation of the negative power supply floating voltage. The proposed architecture was implemented as part of a galvanically isolated gate driver in a standard 0.25μ m BCD technology. Simulation and experimental results validate the proper functionality.
浮动或不浮动-栅极驱动器的负电源诊断
本文提出了一种检测栅极驱动器负电源引脚浮动状态的体系结构。该架构监视负电源电压,并将其与基于二极管压降的内部参考电压进行比较。该技术补偿了负电源浮动电压的温度变化。所提出的架构在标准的0.25μ m BCD技术中作为电隔离栅极驱动器的一部分实现。仿真和实验结果验证了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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