EDDNet: An Efficient and Accurate Defect Detection Network for the Industrial Edge Environment

Abstract

Defect detection aims to locate the accurate position of defects in images, which is of great significance to quality inspection in the industrial product manufacturing. Currently, many defect detection methods rely on deep neural networks to extract features. Although the accuracy of these methods is relatively high, it is computationally intensive, making the methods difficult to deploy in resource-limited edge devices. In order to solve these problems, a lightweight defect detection model for the industrial edge environment is proposed, termed the efficient defect detection network (EDDNet). EfficientNet-B0 is used as the feature extraction backbone, extracting feature maps from feature layers of different depths of the network and fusing multilevel features by multilevel feature fusion (MFF). To obtain more information, we redesign the attention mechanism in MBConv blocks, taking the encoding space (ES) attention mechanism as a new module, which solves the problem that the defective image spatial information is ignored. The experimental results on the NEU-DET and DAGM2007 datasets and PCB defect datasets demonstrate the effectiveness of the proposed EDDNet and its possibility for application in industrial edge device.