An RTL ATPG Flow Using the Gate Inherent Fault (GIF) Model Applied on Non-, Standard- and Random-Access-Scan (RAS)

Abstract

The idea to use functional test pattern for production tests has been gaining more and more attention throughout the last years. We argue, that the gate inherent fault (GIF) model can add substantial value to this field. The GIF model allows synthesis independent RTL ATPG which achieves 100% stuck-at fault coverage on gate level. This paper proposes an RTL ATPG flow based on the GIF model. The peak memory usage can be adjusted. The test sets generated on RTL are then applied on 3 essential different test structures. The paper demonstrates the benefits of using multi-cycle-capture test sets which can efficiently be generated on RTL using the GIF model.