Voltage endurance committee round robin. Aging by full and half wave signals

Abstract

For the past several years, the Voltage Life Committee of the EIS has been investigating the question of the frequency accelerated aging of magnet wire twists. The frequency acceleration of voltage endurance testing was reviewed and summarized in a recent IEEE symposium report [1]. While the intended purpose of such reviews is to evaluate the “state of the art” regarding a particular topic, they invariably raise additional questions for consideration. In this way, questions about the expected performance of magnet wire twist materials under variable frequency impulse stresses and about voltage aging of twists as a function of rectified half waves were brought up. The University of Connecticut, with the support and guidance of the Voltage Life Committee, has attempted to explore these questions as part of a summer program. Some results from this collaborative research are being reported in this paper.