On the back-action of THz measurement on the total current of quantum devices

D. Marian, N. Zanghí, X. Oriols
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引用次数: 5

Abstract

Measuring a quantum system implies some kind of perturbation of the system itself. A novel approach to include the perturbation of the quantum electron device, i.e. the back-action, due to the TeraHertz (THz) measurement of the total current is presented. The approach is based on a microscopic description of the interaction between the quantum system and the measuring apparatus, in terms of conditional (Bohmian) wave functions. The disturbance of the quantum system due to measurements at THz frequencies and the (perturbed) value of the total current is numerically computed for a simple two-terminal device. Contrarily to traditional strong (i.e. projective) measurements, it is shown that the measurement of the total current at THz frequencies can be modeled by a weak measurement. An additional unavoidable source of fluctuations of the current is predicted at THz frequencies due to the back-action (i.e. the quantum measurement).
太赫兹测量对量子器件总电流的反作用
测量一个量子系统意味着系统本身的某种扰动。提出了一种新的方法来包括量子电子器件的微扰,即由于太赫兹(THz)测量总电流的反作用。该方法基于量子系统和测量仪器之间相互作用的微观描述,以条件波函数的形式。对一个简单的双端器件,用数值方法计算了太赫兹频率测量引起的量子系统扰动和总电流的扰动值。与传统的强(即投影)测量相反,太赫兹频率下总电流的测量可以通过弱测量来模拟。在太赫兹频率下,由于反向作用(即量子测量),预计还有一个不可避免的电流波动源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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