Unsupervised Surface Defect Detection Using Deep Autoencoders and Data Augmentation

A. Mujeeb, Wenting Dai, Marius Erdt, A. Sourin
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引用次数: 23

Abstract

Surface level defect detection, such as detecting missing components, misalignments and physical damages, is an important step in any manufacturing process. In this paper, similarity matching techniques for manufacturing defect detection are discussed. We are proposing an algorithm which detects surface level defects without relying on the availability of defect samples for training. Furthermore, we are also proposing a method which works when only one or a few reference images are available. It implements a deep autoencoder network and trains input reference image(s) along with various copies automatically generated by data augmentation. The trained network is then able to generate a descriptor—a unique signature of the reference image. After training, a test image of the same product is sent to the trained network to generate a test image descriptor. By matching the reference and test descriptors, a similarity score is generated which indicates if a defect is found. Our experiments show that this approach is more generic than traditional hand-engineered feature extraction methods and it can be applied to detect multiple type of defects.
基于深度自编码器和数据增强的无监督表面缺陷检测
表面水平缺陷检测,如检测缺失的部件,错位和物理损伤,是任何制造过程中的重要步骤。本文讨论了用于制造缺陷检测的相似匹配技术。我们提出了一种不依赖缺陷样本可用性进行训练的表面缺陷检测算法。此外,我们还提出了一种在只有一个或几个参考图像时有效的方法。它实现了一个深度自动编码器网络,并训练输入参考图像以及由数据增强自动生成的各种副本。然后,经过训练的网络能够生成一个描述符——参考图像的唯一签名。训练后,将同一产品的测试图像发送到训练后的网络中,生成测试图像描述符。通过匹配引用和测试描述符,生成一个相似度分数,它指示是否发现了缺陷。实验表明,该方法比传统的手工特征提取方法更具通用性,可用于检测多种类型的缺陷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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