Angle-resolved single-wavelength 1D inverse profiling with a CSI approach

L.F. van Rijswijk, T. Zacharopoulou, R. Dirks, M. V. van Beurden
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Abstract

We study the behavior of the contrast source inversion method in case of a one-dimensional electromagnetic inverse profiling problem with angular data only. We analyze the update strategy via a local quadratic approximation, which leads to a modification in the update strategy for the contrast source. With this modification, we obtain significant improved results when reconstructing with angular data. Additionally, we discuss conditions for the angles of incidence for which it is most likely to have a successful reconstruction.
角度分辨单波长一维反剖面与CSI方法
研究了仅含角数据的一维电磁反剖面问题中对比源反演方法的性能。我们通过局部二次逼近来分析更新策略,这导致了对对比源更新策略的修改。通过这种改进,在用角度数据进行重构时,得到了明显的改善。此外,我们还讨论了最有可能成功重建的入射角的条件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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