Hot-carrier behaviour and ron-BV trade-off optimization for p-channel LDMOS transistors in a 180 nm HV-CMOS technology

Abstract

This work reports the hot-carrier (HC) behavior and specific on-resistance (Ron,sp) optimization of 20~60 V p-channel LDMOS transistors implemented in a 180 nm HV-CMOS technology. By precise control the implant dose and energy of a p-drift region, which is surrounded by n-type isolation well, one can efficiently optimize the on-resistance and breakdown voltage (BV) trade-off while keeping very low HC degradation. Both of the TCAD simulations and measurements are described to explain the proposed technology and the transistor behaviour. Reported p-channel LDMOS transistor (pLDMOS) shows a very low HC-induced degradation - percent change of linear region of drain current (Idlin) below 3 % till 1×105 sec stress), and it shows an excellent Ron,sp-BV trade-off (pLDMOS with 20V GOX: BV = -85 V and Ron,sp = 1.64 mΩ-cm2).