Wolfgang Raschke, Massimiliano Zilli, Johannes Loinig, R. Weiss, C. Steger, Christian Kreiner
{"title":"Test-driven migration towards a hardware-abstracted platform","authors":"Wolfgang Raschke, Massimiliano Zilli, Johannes Loinig, R. Weiss, C. Steger, Christian Kreiner","doi":"10.5220/0005216302610267","DOIUrl":null,"url":null,"abstract":"Platform-based development is one of the most successful paradigms in software engineering. In embedded systems, the reuse of software on several processor families is often abandoned due to the multitude of compilers, processor architectures and instruction sets. In practice, we experienced that a lack of hardware abstraction leads to non-reusable test cases. We will demonstrate a re-engineering process that follows test-driven development practices which fits perfectly for migration activities. Moreover, we will introduce a process that provides trust for the test cases on a new hardware.","PeriodicalId":345016,"journal":{"name":"2015 International Conference on Pervasive and Embedded Computing and Communication Systems (PECCS)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Conference on Pervasive and Embedded Computing and Communication Systems (PECCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5220/0005216302610267","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Platform-based development is one of the most successful paradigms in software engineering. In embedded systems, the reuse of software on several processor families is often abandoned due to the multitude of compilers, processor architectures and instruction sets. In practice, we experienced that a lack of hardware abstraction leads to non-reusable test cases. We will demonstrate a re-engineering process that follows test-driven development practices which fits perfectly for migration activities. Moreover, we will introduce a process that provides trust for the test cases on a new hardware.