Tracking Deadtime Algorithm for GaN DC/DC Converter

Abstract

The presented method automatically adjusts the deadtime of gallium nitride (GaN) transistors in half-bridge to increase the efficiency. This removes the need of manual measuring and setting the deadtime of the finished converter. The developed algorithm was tested and compared with the fixed deadtime case. The obtained results show that the developed algorithm is achieving higher and more stable efficiency compared to selected fixed deadtime.