De-embedding techniques for transmission lines: An application to measurements of on-chip coplanar traces

Abstract

In this paper, the de-embedding study presented in the work of Erickson et al. (2013) is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in work of Erickson et al. is reformulated so that only two measurement standards are required, as opposed to three. The results of de-embedding the measurement data are discussed, as well as challenges with making the measurements.