{"title":"Electromagnetic transient simulation of power electronic equipment in power systems: challenges and solutions","authors":"A. Gole","doi":"10.1109/PES.2006.1709562","DOIUrl":null,"url":null,"abstract":"The panel presentation identities requirements for electromagnetic transient simulation programs for simulating large power networks with embedded power electronics. Interpolation based simulation and other methods are discussed which provide precision in simulation of semiconductor switching events without a corresponding penalty in computer time. A method for accurately estimating power semiconductor losses without significant increase in the simulation time is discussed. The use of simulation in design requires multiple runs to explore a wide range of operating scenarios and component tolerances. Intelligent methods, including those based on nonlinear optimization limit the these runs to the most promising areas of the parameter space and considerably reduce the design cycle time","PeriodicalId":267582,"journal":{"name":"2006 IEEE Power Engineering Society General Meeting","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE Power Engineering Society General Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PES.2006.1709562","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 19
Abstract
The panel presentation identities requirements for electromagnetic transient simulation programs for simulating large power networks with embedded power electronics. Interpolation based simulation and other methods are discussed which provide precision in simulation of semiconductor switching events without a corresponding penalty in computer time. A method for accurately estimating power semiconductor losses without significant increase in the simulation time is discussed. The use of simulation in design requires multiple runs to explore a wide range of operating scenarios and component tolerances. Intelligent methods, including those based on nonlinear optimization limit the these runs to the most promising areas of the parameter space and considerably reduce the design cycle time