{"title":"High Reliabilities Design of Stacked Ultra-High-Voltage nLDMOSs in a 0.5-μm BCD Semiconductor Technology","authors":"Shen-Li Chen","doi":"10.33552/mcms.2021.04.000593","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":297187,"journal":{"name":"Modern Concepts in Material Science","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Modern Concepts in Material Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.33552/mcms.2021.04.000593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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