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Assessment of the Quality of Raw Measurement from Samsung SOC GNSS Chip and Analysis of Positioning Accuracy Using PPP

The International Technical Meeting of the The Institute of Navigation Pub Date : 2022-02-14 DOI:10.33012/2022.18181
Bogeun Cho, Bugyeom Kim, Jong Heon Kim, C. Kee, Sunkyoung Yu, O. Kim, Jungbeom Kim
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三星SOC GNSS芯片原始测量质量评估及PPP定位精度分析
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The International Technical Meeting of the The Institute of Navigation
The International Technical Meeting of the The Institute of Navigation
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