H. Inokawa, Yuto Goi, Toshiaki Yorigami, Kyohei Shirotori, H. Satoh, M. Tomita, T. Matsuki, H. Ikeda, Takanobu Watanabe
{"title":"Substrate Bias Effect on SOI-based Thermoelectric Power Generator","authors":"H. Inokawa, Yuto Goi, Toshiaki Yorigami, Kyohei Shirotori, H. Satoh, M. Tomita, T. Matsuki, H. Ikeda, Takanobu Watanabe","doi":"10.1109/QIR54354.2021.9716172","DOIUrl":null,"url":null,"abstract":"Thermoelectric characteristics of phosphorus-doped silicon (Si) nanowire (NW) are evaluated in terms of the substrate bias effect. It is found that the narrower wire is more sensitive to the substrate voltage presumably due to the field crowding effect. In case of 200-nm-wide NW, application of 40 V to the substrate increases the NW conductance by a factor of 55.4, and leads to × 25.9 improvement in power generation, even though the Seebeck coefficient is reduced to 74%. The result suggests that the performance of the Si thermoelectric generator could be improved or optimized by the substrate bias control.","PeriodicalId":446396,"journal":{"name":"2021 17th International Conference on Quality in Research (QIR): International Symposium on Electrical and Computer Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 17th International Conference on Quality in Research (QIR): International Symposium on Electrical and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QIR54354.2021.9716172","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Thermoelectric characteristics of phosphorus-doped silicon (Si) nanowire (NW) are evaluated in terms of the substrate bias effect. It is found that the narrower wire is more sensitive to the substrate voltage presumably due to the field crowding effect. In case of 200-nm-wide NW, application of 40 V to the substrate increases the NW conductance by a factor of 55.4, and leads to × 25.9 improvement in power generation, even though the Seebeck coefficient is reduced to 74%. The result suggests that the performance of the Si thermoelectric generator could be improved or optimized by the substrate bias control.