Variability-Aware Characterization of Current Mirrors Based on Organic Thin-Film Transistors on Flexible Substrates

Abstract

The variability of the electrical characteristics of current-mirror circuits based on organic thin-film transistors is analyzed using experimental data obtained from a large number of discrete transistors and from a large number of current mirrors fabricated on a flexible polymeric substrate. Depending on the channel length of the transistors (5 μm or 2 μm) and on whether the two transistors comprising the current mirror are biased simultaneously or separately, the drain-current mismatch of the current mirrors is as small as 1% and as large as 25%.