Preferential Growth of Secondary Recrystallized Goss Grains During Secondary Recrystallization Annealing in Grain Oriented Silicon Steel Sheet

Texture, Stress, and Microstructure Pub Date : 1900-01-01 DOI:10.1155/TSM.26-27.413

Y. Inokuti

引用次数: 9

Abstract

Computer color mapping of the primary and secondary recrystallized Goss grains which formed during secondary recrystallization annealing was performed with an image analyzer, using crystallographic orientation data measured by a Kossel examination.

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晶粒取向硅钢片二次再结晶退火过程中Goss晶粒的优先生长

利用科塞尔检验测量的晶体取向数据，利用图像分析仪对二次再结晶退火过程中形成的一次和二次再结晶Goss晶粒进行了计算机颜色映射。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Texture, Stress, and Microstructure

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